Universität Paderborn



Universität Stuttgart
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Veröffentlichungen


Konferenzbeiträge

Scan Chain Clustering for Test Power Reduction
Proceedings 45th ACMIEEE Design Automation Conference (DAC’08), Anaheim, CA, 2008, pp. 828-833
M. Elm, H.-J. Wunderlich, M. Imhof, C. Zoellin, J. Leenstra, and N. Maeding

Scan chain organization for embedded diagnosis
Proceedings Design, Automation and Test in Europe (DATE’08), Munich, Germany, March 2008, pp. 468-473
M. Elm and H.-J. Wunderlich

A Diagnosis Algorithm for Extreme Space Compaction
Proceedings Design Automation and Test in Europe (DATE’09), Nice, France, 2009, pp. 1355-1360
S. Holst and H.-J. Wunderlich

Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair
Proceedings 10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Krakow, Poland, April 2007, pp. 185-190
P. Öhler, S. Hellebrand, H.-J. Wunderlich

Adaptive debug and diagnosis without fault dictionaries
Proceedings 12th IEEE European Test Symposium (ETS’07), Freiburg, Germany, May 2007, pp. 7-12, 2007
S. Holst and H.-J. Wunderlich

An Integrated Built-in Test and Repair Approach for Memo¬ries with 2D Redundancy
Proceedings 12th IEEE European Test Symposium (ETS’07), Frei¬burg, Germany, May 2007, pp. 91-96
P. Öhler, S. Hellebrand, H.-J. Wunderlich

Test Encoding for Extreme Response Compaction
Proceedings 14th IEEE European Test Symposium (ETS’09), Sevilla, Spain, May 2009, pp. 155-160
M. Kochte, S. Holst, M. Elm and H.-J. Wunderlich

A Modular Memory BIST for Optimized Memory Repair
Proceedings IEEE International On-Line Testing Symposium 2008 (IOLTS'2008), Rhodes, Greece, July 2008, pp. 171-172
P. Öhler, A. Bosio, G. Di Natale, Sybille Hellebrand

Adaptive debug and diagnosis without fault dictionaries
accepted for Journal of Electronic Testing – Theory and Applications (JETTA), DOI: 10.1007/s10836-009-5109-3
S. Holst and H.-J. Wunderlich

X-masking during logic BIST and its impact on defect coverage
IEEE Transactions on Very Large Scale Integration Systems (TVLSI), Vol. 14, No. 2, 2006, pp. 193-202
Y. Tang, H.-J. Wunderlich, P. Engelke, I. Polian, B. Becker, J. Schlöffel, F. Hapke, and M. Wittke

Modularer Selbsttest und optimierte Reparaturanalyse
Proceedings 2. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf", Ingolstadt, September 2008, pp. 49-56
P. Öhler, A. Bosio, G. Di Natale, Sybille Hellebrand

 

Eingeladene Zeitschriften- und Konferenzbeiträge

Some common aspects of design validation, debug and diagnosis
Proceedings Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA’06), Kuala Lumpur, Malaysia, 17-19 January 2006, pp. 3-10
T. Arnaout, G. Bartsch, and H.-J. Wunderlich

Debug and diagnosis: Mastering the life cycle of nano-scale systems on chip
Proceedings MIDEM 2007 - International Conference on Micro¬electro¬nics, Devices and Materials and the Workshop on Electronic Testing, Bled, Slovenia, September 2007, pp. 27-36
H.-J. Wunderlich, M. Elm, and S. Holst

Debug and diagnosis: Mastering the life cycle of nano-scale systems on chip
Informacije MIDEM, Vol. 37, No. 4(124), Ljubljana, December 2007, pp. 235-243
H.-J. Wunderlich, M. Elm, and S. Holst

 

Buch Beiträge

Generalized Fault Modeling for Logic Diagnosis
in H.-J. Wunderlich (Ed.), “Model Based Hardware Testing,” Springer, to appear November 2009
H.-J. Wunderlich, S. Holst

 

Workshop Beiträge

Adaptive debug and diagnosis without fault dictionaries
19th GI/ITG/GMM Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’07), Erlangen, Germany, March 2007
S. Holst and H.-J. Wunderlich

An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy
19th GI/ITG/GMM Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’07), Erlangen, Germany, March 2007
P. Öhler, S. Hellebrand, H.-J. Wunderlich

Prüfpfad Konfigurationen zur Optimierung der diagnostischen Auflösung
20th GI/ITG/GMM Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’08), Vienna, Austria, February 2008
M. Elm and H.-J. Wunderlich

Diagnose mit extrem kompaktierten Fehlerdaten
21st GI/ITG/GMM Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’09), Bremen, Germany, February 2009
S. Holst and H.-J. Wunderlich

 

Eingeladene Reden

Challenges in the Diagnosis of Nanoelectronic Systems
Invited Talk at IEEE East-West Design & Test Symposium (EWDTS’07), Yerevan, Armenia, September 2007
H.-J. Wunderlich

Embedded Diagnosis – A Key to Reliable Systems
Invited Talk at IEEE Latin Ameri¬can Test Workshop, Buzios, Rio de Janeiro, Brasil, March 2009
H.-J. Wunderlich